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DSIE (Dynamic spectroscopic imaging ellipsometer) - Normal incidence type

  • Reg. Date : 07.25 2023
  • Writer : omlnorilab
  • View : 328

DSIE (Dynamic spectroscopic imaging ellipsometer) - Normal incidence type



  • DSIE (Dynamic spectroscopic imaging ellipsometer) - Normal incidence type

  • DSIE (Dynamic spectroscopic imaging ellipsometer) - Normal incidence type

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DSIE_ver2.jpg (749.9 KB)
DSEI_ver2_1.jpg (531.5 KB)

OML
Opitcal Metrology Laboratory

4th Engineering Bld., Room #: 4317, Chonbuk National University, 567, Baekje-daero, Deokjin-gu, Jeonju-si, Jeollabuk-do, Republic of Korea
Tel : +82-63-270-4632, Fax : +82-63-270-2388 / Email : dashi.kim@jbnu.ac.kr